SX1934 Four Probe Tester SX1903 Four Probe Tester SX1934B Four Probe Tester SX1934C Four Probe Tester
 
 
 

TYPEㄩSX1934 Digital Four Probe Tester

 
 
 
General Description
 

The purpose of the 4-point probe is to measure the resistivity of any semiconductor material, it is widely used in fields of semiconductor and solar energy.

 
 
Product Feature
High precision and high stability measurement for the sheet resistance & resistivity according to A.S T.M
adopt swith control and work state led to display.
SX1903 probes offer the accuracy and perfection of more than 20 years experience, It has high measuring
sensitivity, easy operating.
 
Photo
 
 
Main Specification
 
Model

SX1934

Measuring
Rangeㄩ10-4〞105次/↓(extended range)
Sheet resistanceㄩ10-3〞104次/↓
resistanceㄩ10-6〞106
Wafer diameter(most)
耳100mm( Standard),Squarenessㄩ230℅220mm(MAX)
Max.resistance test error(according to JJG508-87)
0.1次﹜1次﹜10次﹜100次≒㊣0.3%㊣2
Outline dimension
400mm℅440mm℅120mm
Weight
Main setㄩ4kg ﹛Test tableㄩ5kg
Test ambient condition
Temperatureㄩ23㊣2⊥
Relative humidityㄩ≒65ㄔ˙
No high frequency
And strong light irradiation tungsten carbide
Power supply
220V㊣10%(50Hz) Consumptionㄩ≒35W
Note
Computer interface
 
 
 
Probetip
 
Consists of four equally spaced tungsten metal tips with finite radius, each tip is supported by springs on the other end to minimize down by the knob during measurements. A high impedance current source is used to
supply current through. The outer two probes, a voltmeter measures the voltage across the inner two probes
to determine the sample resistivity.
 
 
     
 
 
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